Research paper “Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications” out now

The Frontiers in Materials Journal has published a research on “Characterization of Heavily Irradiated Dielectrics for Pixel Sensors Coupling Insulator Applications” in its Semiconductor Materials and Devices section. Okmetic Customer Support Manager Akiko Gädda was one of the co-authors of this highly interesting research utilizing Okmetic 150mm boron-doped Magnetic Czochralski (MCz) silicon wafers as a substrate. The link for the research paper can be found here.