Artificial intelligence project provides tools for silicon wafer inspection – rare deviations can be detected even in larger data samples
VTT organizes a virtual event Boosting growth with Finnish microelectronics on 20 May 2021 – Okmetic’s CTO participates in the panel discussion
Upcoming Webinar – Optimized Silicon Wafers: The Ultimate Solution for Improved RF filter and Device Performance
Okmetic’s Customer Support Manager Angela Franklin is giving a speech at MEMS & Sensors Technical Congress